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MX7524SE/883B Datasheet

Download or read online Maxim Integrated MX7524SE/883B CMOS BUFFERED, MULTIPLYING 8-BIT D/A CONVERTER pdf datasheet.



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SCOPE:
CMOS, BUFFERED, MULTIPLYING 8-BIT D/A CONVERTER
Device Type
Generic Number
01
MX7524S(x)/883B
02
MX7524T(x)/883B
03
MX7524U(x)/883B
Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows:
Outline Letter
Mil-Std-1835
Q
GDIP1-T16 or CDIP2-T16
E
CQCC1-N20
Absolute Maximum Ratings:
V
to GND ..................................................................................................... -.3V, + 17V
DD
V
to GND ................................................................................................................ 25V
RFB
V
to GND ................................................................................................................ 25V
REF
Digital Input Voltage to GND ......................................................................... -0.3V to V
V
, V
, 0 to GND .................................................................................. -0.3V to V
OUT1
OUT2
Lead Temperature (soldering, 10 seconds) ................................................................... +300 C
Storage Temperature ...................................................................................... -65 C to +150 C
Continuous Power Dissipation ..........................................................................….. T
16 pin CERDIP(derate 10mW/ C above +70 C) ....................................................…. 800mW
20 pin LCC(derate 9.1mW/ C above +70 C) .........................................................…. 727mW
Junction Temperature T
.....................................................................................….. +150 C
J
Thermal Resistance, Junction to Case,
16 pin CERDIP................................................................................................…... 50 C/W
20 pin LCC .....................................................................................................…... 20 C/W
Thermal Resistance, Junction to Ambient,
16 pin CERDIP.............................................................................................…... 100 C/W
20 pin LCC ...................................................................................................….. 110 C/W
Recommended Operating Conditions
Ambient Operating Range (T
) .........................................................….. -55 C to +125 C
A
Supply Voltage Range ..............................................................................….. +5V to +15V
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
----------------------------
Electrical Characteristics of MX7524/883B
Circuit Function
DAC with .5 LSB
DAC with .25 LSB
DAC with .125 LSB
Case Outline
16 LEAD CERDIP
20 LCC
JC
JA:
Package Code
J16
L20
DD
DD
=+70 C
A
19-2451
Rev. C
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Summary of Contents

Page 1

SCOPE: CMOS, BUFFERED, MULTIPLYING 8-BIT D/A CONVERTER Device Type Generic Number 01 MX7524S(x)/883B 02 MX7524T(x)/883B 03 MX7524U(x)/883B Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows: Outline Letter Mil-Std-1835 Q GDIP1-T16 or CDIP2-T16 E CQCC1-N20 Absolute ...

Page 2

TABLE 1. ELECTRICAL TESTS: TEST Symbol ACCURACY Resolution NOTE 4 RES Relative Accuracy RA Relative Accuracy RA Gain Error NOTE 2 AE Gain Error NOTE 2 AE Power Supply Rejection PSRR Power Supply Rejection PSRR Output Leakage Current I OUT1 ...

Page 4

... DAC responds to data bus (DB0-BD7) inputs Hold Data bus (DB0-DB7) is locked out; DAC holds last data present when ___ __ Hold assumed High state. Pkg. Code J16 MX7524SQ/883B L20 MX7524SE/883B J16 MX7524TQ/883B L20 MX7524TE/883B J16 MX7524UQ/883B L20 MX7524UE/883B L20 NC OUT1 OUT2 GND ...

Page 5

QUALITY ASSURANCE Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil- Std-883. Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015: 1. Test Condition ...

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